ISMTII-2009
The 9th International Symposium on Measurement Technology and Intelligent Instruments
29 June - 2 July 2009      Saint-Petersburg, Russia

Keynote Speakers

Corresp. member of RAS Alexander V. Latyshev, Institute of Semiconductor Physics, SB RAS, Russia
Precision Measuring in Nanoscale Range

Academician Gennady Kulipanov, Prof. B.A. Knyazev, Budker Institute of Nuclear Physics, SB RAS, Russia
High-Power Terahertz Novosibirsk Free Electron Laser: Instrumentation Development and Experimental Achievements

Prof. Wei Gao, Tohoku University, Japan
Fast Measuring Technologies for Ultra-Precision Manufacturing

Prof. Albert Weckenmann, University Erlangen-Nuremberg, Germany
Computed Tomography for Application in Manufacturing Metrology

Prof. Kuang-Chao Fan, National Taiwan University, Taiwan
A Scanning Contact Probe for Micro CMM

Prof. Xiangqian (Jane) Jiang, University of Huddersfield, UK
The Evolution of Surfaces and their Measurement

Prof. Shulian Zhang, Tsinghua University, China
Orthogonally Polarized Lasers and Laser Self-Sensing Technologies

Prof. Peter Rolfe, Oxford BioHorizos Ltd, UK
The Impact of Micro and Nano Sensors in Biomedical Measurement

Prof. Vladimir M. Petrov, State Institute for Art Studies, Russia
In Search for New Paradigm for Humanitarian Measurements: Informational Path Between Scylla of Subjectivism and Harybdis of Operationalism

Prof. Valery S. Alexandrov, Prof. Roald E. Taymanov, Prof. Anna G. Chunovkina, VNIIM, Russia
Topical Tasks of Metrology due to Measuring Instruments Computerization

Prof. Harald Bosse, Physikalisch-Technische Bundesanstalt, Germany
Nano-and Micrometrology in PTB-State-of the-Art and Future Challenges

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Invited Session Speakers

Prof. Pavel A. Todua, Center for Surface and Vacuum Research, Russia
Metrological and Standartization Base of Nanotechnologies

Prof. Tilo Pfeifer, RWTH Aachen University, Germany
THz-Imaging on its Way to Industrial Application

Prof. Mitsuo Takeda, The University of Electro-Communications, Japan
Optical Vortex Metrology

Prof. Abou-Zeid, Physikalisch-Technische Bundesanstalt, Germany
Application of Diode Lasers in Interferometrical Length Measurements

Prof. Hidenori Mimura, Shizuoka University, Japan
Novel X-Ray Imaging Using a CdTe Sensor

Prof. Robert Schmitt, Fraunhofer–Institute for Production Technology, Germany
Visual Inspection using X-Ray Computer Tomography - Non-destructive 3D-Quality Assurance

Prof. Boris Chichkov, Dr. Roman Kiyan, Laser Zentrum Hannover e.V., Germany
3D Micro- and Nanofabrication Using Femtosecond Lasers

Prof. Richard Leach, National Physical Laboratory, UK
Traceability for Areal Surface Texture Measurement

Dr. Sergey Peltek, Institute of Cytology and Genetics, SB RAS, Russia
Micro-Nano Fluid Bio-Analytical Systems: Medical, Bio-Technological and Ecological Applications

Prof. Hartmut Bartelt, Institute of Photonic Technology, Germany
Trends in Bragg Grating Technology for Optical Fiber Sensor Applications

Dr. Andrew Yacoot, National Physical Laboratory, UK
Nanotrace: the Investigation of Non-Linearity in Optical Interferometers Using X-Ray Interferometry

Prof. Vladimir Lukin, Institute of Atmospheric Optics, SB RAS, Russia
Wave-Front Sensors for Adaptive Optics Application

Dr. Michael Krystek, Physikalisch-Technische Bundesanstalt, Germany
Principles of Bayesian Methods in Data Analysis

Dr. Jürgen Kompenhans, Institute of Aerodynamics and Flow Technology, Germany
Industrial Applications of Image Based Measurement Techniques in Aerodynamics – Problems, Progress and Future Needs

Prof. Sergey Babin, Institute of Automation and Electrometry, SB RAS, Russia
Fiber-Optic Sensor Systems and Their Applications

Prof. Junfeng Song, National Institute of Standards and Technology, USA
Three Steps Towards Metrological Traceability for Ballistics Measurements

Prof. Seung-Woo Kim, KAIST, South Korea
Multi-Channel Optical Frequency Generator for Absolute Distance Metrology

Prof. Liang-Chia Chen, National Taipei University of Technology, Taiwan
Dynamic 3-D Surface Profilometry Using a Novel Color Pattern Encoded with a Multiple Triangular Model

Prof. Ksenia Sapozhnikova, Prof. Roald Taymanov, VNIIM, Russia
Improvement of Traceability of Widely-Defined Measurements in the Field of Humanities

Prof. Yasuhiro Takaya, Osaka University, Japan
New Probing System for the Nano-CMM Using Radiation Pressure Controlled Microsphere

Prof. Ude D. Hangen, Hysitron, Inc., Germany
Transients of Deformation at Nanoscale Observed in Displacement Controlled Nanoindentation Testing

Prof. Kiyoshi Takamasu, University of Tokyo, Japan
Uncertainty Evaluation for Coordinate Metrology by Intelligent Measurement

Dr. Konrad Herrmann, Physikalisch-Technische Bundesanstalt, Germany
A Microelectromechanical Nanoindentation Instrument with the Force Resolution of 1 nN

Prof. Wolfgang Osten, Universität Stuttgart, Germany
Testing Aspheric Lenses: Some New Approaches with Increased Flexibility

Prof. Victor Bykov, Research-and-Production Group of Enterprises “NT-MDT”, Russia
NT-MDT for Innovations Instruments Engineering

Prof. Wen-Yuh Jywe, National Formosa University, Taiwan, ROC
Development of the Equipments for Nano Photonic Crystal

Prof. Lev Zuev, Institute of Strength Physics and Materials Science, SB RAS, Russia
Alternative Speckle Photography Techniques for Plastic Deformation Investigation

Prof. Sergey V. Muravyov, Tomsk Polytechnic University, Russia
Preference Aggregation: Measurement Theoretic Aspects, Algorithms and Present Applications