ISMTII-2009
The 9th International Symposium on Measurement Technology and Intelligent Instruments
29 June - 2 July 2009      Saint-Petersburg, Russia

Symposium Scope

1. General Problems of Measurement, including:
   - Fundamental Problems
   - Emerging Physical Principles of Measurements
   - Uncertainty, Traceability, Calibration
   
2. Micro- Nano- Measurements and Metrology, including:
   - 3D Micro / Nano- Measurement and Fabrication Techniques
   - Measurements for Micro-Optics and Nano-Photonics
   
3. Optical and X-Ray Tomography and Interferometry
4. Measurements for Geometrical and Mechanical Quantities, including:
   - Dimensional and Surface Measurements
   - 3D Inspection and Metrology
   - Measurement of Motion Parameters
   
5. Terahertz Technologies for Science, Industry, Medicine, Biology
6. Novel Measurement and Diagnostic Methods, including:
   - Femtosecond Laser Pulses Measurement Techniques
   - Advanced Semiconductor Optoelectronic Sensors and Instruments
   - Nonlinear Optical Instruments Applied for Industry
   - Optical Fiber Measurements and Sensors
   - Ultra Precision Wave Front Measurement Techniques
   - Remote Sensoring and Signal Processing
   - Novel Methods for Medical and Biological Measurement
7. Intelligent Measuring Instruments and Systems for Industry and Transport,
   including:
   - Algorithms and Software
   - Metrological Assurance In-Process and On-Line
   - Metrological Self-Diagnostics
   - Methods for Testing of Long Lifetime Sensors
   
8. Measurements and Metrology for the Humanitarian Fields
9. Metrology and Characterization of Materials, including:
   - Hardness Measurements
   - Analytical Measurements
   
10. Education in Measurement Science